ARGUS大面積鍍膜玻璃離線表面掃描光電檢查
測量玻璃鍍膜透光率反射率鍍膜厚度顏色值差異面電阻值
產品簡介
ARGUS大面積鍍膜玻璃離線表面掃描光電檢查設備，測量儀器已安在多滾軸平臺上，快速掃描地檢查透光率、反射率、鍍膜厚度、顏色值差異和面電阻值。離線檢查，可作來料、成品檢查、半成品抽樣檢查。
產品詳介
ARGUS³© 5.7大面積鍍膜玻璃離線表面掃描光電檢查設備，專門為大面積鍍膜玻璃檢查而設，可處理*大面積2200 x 2600mm 及*大厚度6mm，測量儀器已安在多滾軸平臺上，手動平放上玻璃在平臺上，可手動選擇或自動按已電腦選定的檢查點，*快以每兩秒一個點續點光譜讀數，而電阻則每4秒一個讀數。
檢測功能包括：透光率、反射率、鍍膜厚度、顏色值差異和面電阻值。設備包含一或兩個光譜儀CORONA PLUS、光學鏡頭，電阻四針探頭。所有測量頭橫向移動，玻璃由滾軸轉向帶動向前，軟件按要編制，可與其他軟件互接吻，例如：TopFilm©。ARGUS掃描軟件提供快速數據處理，快速分析，可靠性高，可直接用于計算鍍膜厚度及疊層分析。直接輸出至試算表如：EXCEL。
ARGUS軟件輸出：鍍膜厚度、光譜曲線、分析結果曲線(可作調整)、面電阻值、分析結果。
其他功能：掃描路線設計(帶預設標淮路線圖)，網絡聯線，預設分析標準曲線圖。報告可作數據跟蹤，符合ISO9000要求。
特性：
光譜設備：
1. 橫闊度 - 約3900mm
2. 掃描的速度 - 每小時1800點
3. 決長范圍 - 400-1680nm
4. 精度 - 波長< 0.05 nm
- 透射率< 0.1 % T
- 反射率< 0.1 % R
面電阻設備：
5. 掃描的速度 - 每小時900點
6. 測量電阻范圍 - 10 mΩ - 100 Ω ohms
7. 準確度 - ±3 % absolute, ± 1 % relative
8. 靈敏度 - ≤ 1%
9. 位置準確度 - ± 5 mm absolute
10. 位置精度 - ± 1 mm
ARGUS³© 5.7 is a surface inspection system for measuring and displaying optical and electrical properties of large-surface areas of coated substrate. The system can determine the transmission, reflection, coating thickness, color values and the electrical resistance of the coating. The maximum sample size is 2200 x 2600 mm and the maximum thickness 6 mm.
The ARGUS³© 5.7 inspection system is equipped with an state-of-the-art spectrometer for analyzing the light transmitted and reflected by the sample and a Keithley source meter for measuring the resistance present on the four-point measuring head. All measuring heads are moved by the Traverse. The sample will be transported by the roller table. These components and tailormade software packages, like TopFilm© and ARGUS software enable the fast and reliable analysis of the electrical and optical properties of the coated glass substrates.
ARGUS³© 5.7 平面鍍膜玻璃光電檢測系統
主要功能是測
The maximum sample size is 2200 x 2600 mm and the maximum thickness is 6 mm
Optical measuring system: (光學測量規格)
- Up to 1800 points per second for optical measurement(measuring range from 400 to 1680nm)
- Up to 900 points per second for optical measurement (measuring range from 400 to 1680nm) and resistance measurement
- Measurement spot size approx. 10 mm
- Medium spectral pixel spacing 3.3 nm
- Wave length accuracy ±1 nm above the wavelength range - 透射 / 反射光譜值
- Photometric measuring range 0.2 - 100 %
- Reproducibility Y, L*, Δa*, Δb*: ± 0.1 %
- Complete spectral range: ± 0.5 %
- Color calculation Y, L*, a*, b* (CIELAB) - 顏色值
- Light sources A, B, C, D50, D55, D65, D85, D75, F2, G, P TL84,Xe
- Standard observation 2°; 10°
- Measurable coating thickness Coatings >50 nm with > 20 % transmission - 薄膜厚度
Resistance measurement: (阻力測量規格)
- Up to 900 points per second
- Measurement diameter approx. 10 mm
- Measuring range 10 mΩ - 5 kΩ resistance - 電阻值
- Peak radius 150 μm
- Load per needle 100 g
- Clearance between probe tips 1 mm
- Accuracy ± 3 % absolute ± 1 % relative
- Sensitivity ≤ 1 %
- Measuring current 1 mA, 10 mA, 100 mA or 500 mA
- Measurement counter Records the number of measurements (must be reset after being replaced)
- Stability X-Y movement of the sensor <20 μm when penetrating the substrate
- Position accuracy ± 5 mm
- Reproducibility ± 1 mm
Glass dimensions:
- Width - min.750 max.2200 mm
- Length - min. 750 max. 2600 mm
- Thickness - min.3 max.6 mm
